DRAM Stress to Fail Test for Maximum Reliability


What happens when 0.01% error occurs on a 99.99% effective device? In this video, Jerry Wang, DRAM business unit head, explains why even a 0.01% error should be eliminated to avoid catastrophic effects, especially in large-scale implementations where hundreds or thousands of modules are in use. At ATP, the process is called TDBI. Many other manufacturers also do this, but ATP does it differently.