The Challenge
Handheld computers are essential productivity tools in several industrial applications that require portability and compact form but with enterprise-level performance and rugged durability. Some of these specialized applications include transportation and logistics, warehousing, manufacturing, retail, postal or parcel deliveries, and more. An ATP customer needed a high-endurance storage device for their rugged handheld computers that aim to improve workflow and boost productivity at low total cost of ownership (TCO).

The Solution  
To meet the customer’s requirement for the storage device’s extended endurance, ATP used its own-designed Rapid Diagnostic Testing (RDT) to filter/characterize the e.MMC according to different criteria based on application requirements. The RDT process began with IC-level characterization beyond JEDEC standards to ensure the reliability of the new die. The design/layout, controller, hardware and firmware were validated at product level using ATP-designed/built testers. Stress accelerants such as temperature, power/voltage and other factors are used to identify qualified/unqualified blocks intended for the customer's specific application needs. Finally, production quality screening ensures the e.MMC’s reliability by detecting and removing weak blocks and ICs.

Employing SLC Mode NAND flash also improved the performance, reliability and endurance the ATP e.MMC, thus providing reliable data storage without prohibitive costs. ATP also performed Joint Validation testing to ensure compatibility with the customer’s host platform. This consisted of compatibility and function tests with customer-supplied host devices and systems to proactively detect bugs and failures.

The Result
Through stringent RDT testing and the use of SLC Mode NAND flash, ATP successfully achieved an average of 50K P/E cycles to meet the customer’s high-endurance requirement. This is significantly higher than the endurance ratings of other standard NAND flash technologies such as 2D/3D MLC (25-30K) and 3D MLC (30-40K). With these achievements, the ATP e.MMC provides excellent performance for the customer’s handheld computers at the best TCO value.

挑战
医疗保健行业面临着历史上最严峻的考验之一。随着呼吸机，临床模拟系统和心电图仪（ECG）等医疗设备对集成在其内的数据存储设备的可靠性需求不断增长，因此对于医疗供应商而言，如何合理的选择存储器供应商进行合作已经成为重中之重的问题。这不仅仅是为了应对当前的危机，更加是为了疫情过后的后-疫情时代做好计划和准备。

解决方案​
过去的十年中， ATP一直为医疗/保健行业提供耐用程度高，可靠性高的SD卡。凭借ATP在医疗行业服务过大量客户的经验和它的一些支持模型，这些成果非常关键，是ATP长期以来利用和获取关键信息的核心基础。借助ATP的差异化来备货长周期物料，这恰恰体现了ATP提供可控BOM和向我们的医疗合作伙伴提供长期供应的能力。长期供应的优势显著，能够应对短期的紧急需求，例如可以救命的呼吸机。

除了稳定的长期供应，ATP在初始化，内容预加载以及SD卡标签方面的生产效率还形成了一站式服务，大大提高了效率，并且能够最大程度地缩短医疗系统的组装和等待时间。 

成效
我们的世界永远在进步，医疗/保健领域适应新规则的能力对于生存与健康至关重要。凭借ATP在提供工业存储器，存储解决方案和一站式服务，以满足医疗行业数据存储需求方面近三十年的经验，ATP无疑可以为创造更加美好的世界锦上添花。

The Challenge
Sudden power loss events are detrimental to solid state drives (SSDs). They can corrupt data or render the storage device unusable. While power loss protection (PLP) mechanisms are available on most industrial SSDs, the need for more intelligent power management and power loss protection cannot be underscored enough. ATP customers want constant assurance that power loss events will not cause massive downtime or lost data that could affect business operations and lead to higher operating costs.

The Solution  
ATP completely redesigned the PLP array on its next-generation SATA and NVMe SSDs. Integrated into ATP PowerProtector 4, the completely new design of the PLP array utilizes a new power management IC (PMIC) and new firmware-programmable MCU that allow the PLP array to perform intelligently in various temperatures, power glitches and power states. 

The Result
The MCU intelligently monitors sudden power failure conditions from a glitch to a surge or a complete outage and performs the necessary action to protect both data and device. Over input voltage protection, power-up inrush current suppression, input power noise de-glitch and fast power on-off control are among the benefits that the new MCU-based design offers to make sure that mission-critical tasks will not be compromised and the customers' total cost of ownership (TCO) yields the best value.

面临挑战
无论是海陆空，用于运输应用的嵌入式系统和计算机系统都会不断遭受环境危害，这些危害可能会损坏部件并影响其性能。一家专门为运输行业提供产品和服务的公司正在使用ATP坚固而可靠的DRAM模块，以确保运行高效，更加安全以及更高的乘客舒适度。 

解决方案
当DRAM模块暴露于灰尘，化学污染物，极端温度和湿度下，可能会导致腐蚀或短路，从而导致故障。为了克服运输应用面临的极端环境危害的挑战，ATP使用保形涂层来防止污染物进入并延长DRAM模块的使用寿命。（根据应用场景的不同，ATP DRAM模块也可以使用抗硫电阻来构建。）

ATP的保形涂层解决方案是基于化学气相沉积（CVD）技术，沉积一层聚对二甲苯涂层。涂层材料符合美国军用材料MIL-I-46058C和防火UL94V-0认证标准。在真空腔内，涂层材料被直接蒸发并受热分解为纳米分子流。然后纳米分子流进入室温涂层室，在DRAM模块电路组件的轮廓上沉积下来，逐渐形成一层均匀的保护膜。

涂层分布非常密集，哪怕0.01 mm的空间内都能均匀分布，因此其表面完全无漏点并且能够保证器件的表面形态，从而可以保护DRAM模块免受灰尘，化学物质，湿润空气和其他有害物质的侵害。

结论​
ATP“仅工业级” DRAM模块是为运输，航空/航天和汽车等工业应用而专门设计的。客户对采用保形涂层保护的ATP DRAM模块的性能稳定，可靠耐用和使用寿命长等特点都感到非常满意。

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