Industrial Enterprise PCIe® Gen4 NVMe SSDs
Key Features
- Available in U.2, M.2, and E1.S form factors
- Enterprise-Class Endurance (1, 2, 5 DWPD options)
- High Quality of Service (QoS)
- UBER < 1 in 10^17
- Industrial temperature operable
- MCU-based Power Loss Protection Design with Level 4 (data-in-flight) protection
Description
In this rapidly evolving data-centric age when Information Technology and Operational Technology are converging, conventional storage solutions no longer suffice. As data deluge continues, centralized computing is increasingly moving to the edge, necessitating a new breed of solid-state drives for enterprises in uncontrolled environments.
ATP Industrial Enterprise SSDs are engineered for the demanding data storage and compute requirements of enterprises at the edge, where temperatures are extreme, operating conditions are rough, and deployments are far-flung, making servicing/replacements difficult. These SSDs possess the relentless reliability, persistent endurance, and tough build of industrial SSDs while meeting the intensive read/write, low latency, high performance, and constant availability of enterprise-class workloads. They simply offer the best of both worlds, making them the ideal storage media in this age of convergence.
Available as U.2, M.2, and E1.S, ATP Industrial Enterprise SSDs offer different capacities, endurance ratings, and may be tailored according to application-specific requirements. They offer hardware power loss protection, advanced Thermal Management, and enhanced ATP-owned firmware capabilities to ensure the highest levels of reliability, data integrity, and long service life for the industrial enterprise. ATP Industrial Enterprise SSDs make excellent boot drives, data storage drives, or mixed use drives.
SpecificationsLatest Update: 2025-10-07 15:35
| Industrial Enterprise PCIe® Gen4 NVMe SSDs | |||
|---|---|---|---|
| Naming | N651Sie | N651Sie | N651Sie |
| Interface | PCIe G4 x4 | PCIe G4 x4 | PCIe G4 x4 |
| Form Factor | M.2 | U.2 | E1.S |
| Dimensions (mm) | 80 x 22 x 3.85 | 100 x 69.85 x 15 | 118.75 x 33.75 x 9.5 |
| Flash Type | TLC | TLC | TLC |
| Capacity | 240 GB to 1.92 TB | 960 GB to 7.68 TB | 960 GB to 7.68 TB |
| Sequential Read (MB/s) up to 1,6,7 | 6,450 | 6,000 | 6,400 |
| Sequential Write (MB/s) up to 1,6,7 | 6,050 | 6,000 | 6,100 |
| Random Read KIOPS up to 2,6,7 | 1,100 | 870 | 1000 |
| Random Write KIOPS up to 2,6,7 | 1,250 | 1,230 | 1,200 |
| Sustained Sequential Write (MB/s) up to 3,6,7 | 820 | 1,100 | 1,100 |
| Sustained Random Write up to 4,6,7 | 100 KIOPS (390 MB/s) | 100 KIOPS (390 MB/s) | 100 KIOPS (390 MB/s) |
| Endurance [DWPD] 8 | 1 DWPD; 2 DWPD and 5 DWPD configurations available upon project support | 1 DWPD; 2 DWPD and 5 DWPD configurations available upon project support | 1 DWPD; 2 DWPD and 5 DWPD configurations available upon project support |
| QoS 99.9999% 5,6,7 | Read <80µs | Write <30µs | Read <80µs | Write <30µs | Read <80µs | Write <30µs |
| Data Retention | 1 year at 55°C (100% P/E cycles) | 1 year at 55°C (100% P/E cycles) | 1 year at 55°C (100% P/E cycles) |
| Power Loss Protection | Yes | Yes | Yes |
| End to End Data Path Protection | Yes | Yes | Yes |
| Sustained Read Power (Max) 7 | <9W | <14.5W | <13W |
| Sustained Write Power (Max) 7 | <11.5W | <17.5W | <15.5W |
| Supply Voltage | 3.3V | 12V | 12V |
| Operating Temperature Tc | -40°C to 85°C (I-Temp) | -40°C to 85°C (I-Temp) | -40°C to 85°C (I-Temp) |
| Storage Temperature Tc | -40°C to 85°C | -40°C to 85°C | -40°C to 85°C |
| Vibration | Sine 16.4G,10~2,000Hz | Sine 16.4G,10~2,000Hz | Sine 16.4G,10~2,000Hz |
| Shock | Half sine 1,500G/0.5ms | Half sine 1,500G/0.5ms | Half sine 1,500G/0.5ms |
| Reliability MTBF @ 25°C | >3,000,000 hours | >3,000,000 hours | >3,000,000 hours |
| UBER | <1 sector per 10^17 bits read | <1 sector per 10^17 bits read | <1 sector per 10^17 bits read |
| Warranty | 5 years | 5 years | 5 years |
1. Sequential Burst Performance tested with IOmeter 4MB, QD64
2. Random Burst Performance tested with IOmeter 4KB, QD64
3. Average Sustained Sequential Write Performance tested with IOmeter, 4MB, QD64 for 4 hours in dirty state ( 24-hour pre-conditioning under 4K random workload )
4. Average Sustained Random Write Performance tested with IOmeter, 4KB, QD64 for 4 hours in dirty state ( 24-hour pre-conditioning under 4K random workload )
5. 4KB Random QD=1
6. Actual performance may vary depending on user conditions and system environment
7. Parameters tested with highest capacity drive
8. DWPD for 5 years tested with JESD219A Enterprise workload
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Downloads
- ATP_ERS_product_flyer_v3




